IWATSU ELECTRIC

Ferrite, Permalloy, Amorphous. Si steel sheet, Powder Core, Troidal, EE Core Single Sheet, Powder, BH, B-H

De facto standard from research and development of soft magnetic materials to production inspection -

High-accuracy and high-precision core loss measurements
IWATSU's B-H analyzer uses the CROSS-POWER method (adopted in IEC62044-3) to achieve high-accuracy and high-precision measurements by integrating processing with low phase errors over the frequency spectrum and by compensating for the amplitude and phase characteristics of current sensing resistors and detection circuits.
After several model changes since its launch in 1984, IWATSU's B-H analyzer has steadily improved accuracy and precision, contributing to the further development of power electronics.

Features
10Hz to 10MHz wideband measurement frequencies(SY-8218)
High power amplifier applied to maximum voltage ±150V, maximum current ±6A, up to 5MHz(SY-5001)
Automatic measurement of temperature characteristics (-55ºC to +180ºC) of up to 4 samples compliant with automotive parts standard AEC-Q200 Grade 0 (SY-330)
Automatic measurement of temperature characteristics (-30ºC to +150ºC) for up to 41 samples(SY-321A)
Achieves the measurement of small piece single board samples with a length of 36mm or more (width of 35mm or less) (SY-956)
Measurements with DC bias superimposed up to 30A are possible(SY-960/961/962)

Passive Components, Antennas, Non-conductive Power Supply, Power Supplies, RF Components, Amplifiers, Analog Amplifiers, Filters, Feedback Loop Analysis, S-parameters, Impedance, Phase

The Bode 500 is the most powerful analyzer from OMICRON Lab. Its ultra-wide frequency range enables precise measurements from 10 mHz* up to 450 MHz.

The Bode 500 offers high linearity and a high dynamic range of > 120 dB to enable accurate vector network analysis, frequency response analysis, and impedance measurements. The switchable inputs provide 50 Ω termination and a high impedance setting with ac-coupled 1 MΩ for measurements on active systems and the use with external probes.

With 66 dB of dynamic range on the output and a maximum power level of 16 dBm, the analyzer offers enough signal injection power for loop gain and output impedance measurements on switching converters and power distribution networks (PDN). These capabilities make the Bode 500 the instrument of choice for power integrity verifications and loop stability measurements.

■Transmission/Reflection
Measure S-parameters of filters such
as EMI filters, cables, amplifiers,
antennas and more.

■Resonance Frequency
Detect even very narrow, high-Q
resonance peaks of piezo elements,
RFID and NFC transponders.

■Frequency Response
Measure the complex transfer
function (Gain/Phase) of active and
passive electronic systems.

■Bode Analyzer Suite
Easy-to-use PC software with
advanced analysis features like circuit
fitting, math expressions and more.

■Complex Impedance
Analyze passive electronic
components and active electronic
circuits.

■Stability Analysis
Analyze electronic control systems
such as power supplies. Generate

■Bode diagrams and Nyquist plots.
Automated Measurements
Integrate the analyzer into
automated systems via its
versatile automation capabilities

SIC, GaN, MOSFET, inverter module, and thermal characteristics.
ON resistance, temperature dependence evaluation, ON voltage.

The PMK BumbleBee® high voltage differential probe series offers industry leading performance up to 500MHz bandwidth for today‘s power device design challenges, especially those using wide bandgap
devices, such as SiC and GaN.

Wide bandwidth 500MHz
200V, 400V, 1kV, and 2kV ranges available
Long cable length 6m,7m version available
High CMRR
4 attenuations (50:1, 100:1, 250:1, 500:1)
Can be used with any instrument with 50Ω input

SIC, GaN, MOSFET, inverter module, thermal characteristics
Evaluation of Temperature Dependence of ON Resistance of SiC Devices
Detect the effect of abnormal temperature rise of ON voltage
Measurement of ON voltage rise caused by overcurrent condition

It reliably measures the ON voltage of switching devices.

The SS-350 probe measures the voltage between switches (ON voltage) when switching devices, such as MOSFETs, are turned on.
By limiting the high voltage that occurs when the devices are turned off, the probe can accurately measure the low ON voltage.
The low ON voltage can then be measured more accurately.

Maximum input voltage +2,000Vpeak
Clamp voltage +1.5V / +2.5V / +5.5V
Clamp voltage and offset voltage can be set and powered from our DS-8000 series oscilloscopes.
* This product can be used only with our DS-8000 series oscilloscopes.

SiC, GaN, IGBT, MOSFET, Power Module, Inverter, Double Pulse Test, High side, Gate signal

High Voltage Optically Isolated Probe - FF-1500 Series
■ Ideal for GaN / SiC high-side VGS measurements
■ Best-in-class >1.5GHz bandwidth, <300ps rise time
■ Industry-leading ultra-low temperature drift of < 0.05%/°C
■ >180dB CMRR from DC to 500kHz, 80dB at 1GHz
■ ±60kV common mode voltage
■ Wide range of differential input voltage tips
■ Quiet operation, no fan
■ Complete galvanic isolation
■ Universal BNC interface - Use with any oscilloscope

Catalog:
https://cdn.shopify.com/s/files/1/0813/9286/1510/files/FireFly_FF-1500A_Datasheet_Rev03_202504.pdf?v=1745990372

The FF-1500 high voltage optically isolated probe offers industry leading performance that combines the ability to accurately resolve high bandwidth, small differential signals in the presence of large common mode voltages with its ultra-high common mode rejection performance across its entire bandwidth. With >1.5GHz bandwidth, wide differential input range, unmatched common mode rejection ratio CMRR up to >180dB (1 billion to 1 rejection), and a 60kV common mode, FireFly® is the ideal measurement solution for both GaN and SiC device characterization and system level design development.

Semiconductor Devices, Power Devices, Wire Bonding, Busbars, Coils

■ Ultra-small sensor head (Minimum Φ0.45mm)
■ Supports isolation current measurement
■ Wide Bandwidth DC ～ 150MHz
■ Measurable current ±140A
■ Available on oscilloscopes with 50Ω BNC input

OpECS Working Principle
When a magnetic field exists at the sensor head, the linearly polarized light is affected by the magnetic field and its oscillation direction changes. The direction of oscillation follows an elliptical orbit according to the direction of the magnetic field, and the change in direction is proportional to the magnitude of the magnetic field. The elliptically polarized light information is sent to the main unit (control unit) at the latter stage, where it is converted from an optical signal to an electrical signal. This signal can be input to an oscilloscope or other device equipped with a 50Ω-terminated BNC connector to measure the current.

SiC, GaN, Power Semiconductor, IGBT, Power Supply, Inverter, Power Converter, Statics Characterization,Compatible with SiC and GaN devices
Supports wafers and low-power devices, High-power devices are also supported Supports microcurrent measurement

With a variety of unit combinations, it is ideal for next-generation semiconductor measurement, supporting characterization in all processes.
It is equipped with an SMU with a maximum voltage of 5kV and a maximum current of 2kA, has pulse output, gate pattern, and microcurrent measurement functions, and strongly supports design evaluation of wide-gap semiconductors such as SiC and GaN.

General Specifications

Gate voltage：±40 V
Voltage range：0.2 ～ 5 kV
Maximum measurement current：2 kA
Current measurement resolution：250 fA

SiC, GaN, IGBT, Power Device, Double Pulse Test, Multi Pulse Test

Switching Analysis Software DS-821 (for DS-8000 Series)
High-voltage and high-current signals with increased speed can be measured at high resolution, and the analysis method can be changed according to the characteristics of the device.

The switching analysis software for the DS-8000 is a plug-in software of the digital oscilloscope DS-8000 Series that analyzes the dynamic characteristics of power devices and displays the analyzed waveforms and results on the screen.

https://www.iwatsu.com/tme/ds/ds8000/ds8000_swsoft/


The analysis targets IGBT, IPM, MOSFET, etc.
The analysis content displays analysis results based on measured parameters such as turn-on, turn-off, reverse recovery, short circuit, etc.
Waveform Data, Measurement Parameters File Saving and Reading Functions
Analyzing the waveform data of the specified range with the cursor

Semiconductor Devices, LSI, Power Supplies, Interface, Memory, Electrical Equipment, Mobile Phone, IC Modules, ESD Testing, TLP, CMTI

TheuniversalTLP/VF-TLP/HMMtestsystemTLP-4010C/3011C
offers advanced features intended for the characterization of circuits, semiconductor devices and discretes like TVS,
varistors, capacitors, in the high-power time domain. It includes high current I-V characteristics in pulsed operation mode,
turn-on/off transient characteristics of the device, breakdown effects, charge recovery effects (e.g. reverse recovery), Safe Operating-Area (SOA) and ESD measurements.

Wafer and package level TLP/VF-TLP/HMM testing
• Ultrafast 50Ω high voltage pulse output with typical
100psrise time
• Built-in HMM(IEC61000-4-2) pulse up to ±10kV
• Highpulseoutputcurrentupto±40A
• High speed 50Ω trigger output for oscilloscopes (synchronous to high voltage pulse output)
• 6programmablepulserisetimes: 100psto50ns
• 8 (optional 9) programmable pulse widths: 0.5ns (optional), 1 ns to 100ns
• Optional pulse width extender increases pulse width up to 1.6µs in 68 programmable steps
• Fast measurement time, typically 0.2s per pulse including one-point DC measurement between pulses
• Efficient software for system control and waveform data management
• The software can control automatic probers (Suss) for fast measurement of complete wafers
• High performance and high-quality component

Double Pulse Test for SiC and GaN

The UFCS models' compact form factor and high current carrying capacity ensure consistent and reliable performance. Whether measuring GaN switching losses or analyzing high-frequency transients, the solder-in shunts always guarantee highest accuracy.

■ Market-leading >1GHz Bandwidth
■ Ultra-low <200 pH Insertion Inductance
■ Various sizes available: 5mΩ, 11mΩ, 24mΩ, 52mΩ
■ For WBG switching loss and pulse current measurements


The UFCS are a result of technological advancement that has not been surpassed in the field of current measurement in modern power electronics. For measurements with highest CMRR requirements the UFCS can be connected to optically isolated voltage probes, like PMK’s FF-1500.
For general purpose measurements the UFCS can also be connected directly to an 50 Ω input measuring instrument. The first model releases of the UFCS shunt series are the 11 mΩ, 24 mΩ and 52 mΩ versions.