Semiconductor Curve Tracer CS-8000 series IWATSU ELECTRIC
- Measuring and Testing Equipment
- Test and Measurement Equipment
- Semiconductor
- Device/Element
- Circuit
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Target Sector (English)
SiC, GaN, Power Semiconductor, IGBT, Power Supply, Inverter, Power Converter, Statics Characterization,Compatible with SiC and GaN devices
Supports wafers and low-power devices, High-power devices are also supported Supports microcurrent measurement -
Use Scenes (English)
With a variety of unit combinations, it is ideal for next-generation semiconductor measurement, supporting characterization in all processes.
It is equipped with an SMU with a maximum voltage of 5kV and a maximum current of 2kA, has pulse output, gate pattern, and microcurrent measurement functions, and strongly supports design evaluation of wide-gap semiconductors such as SiC and GaN. -
Sales point (English)
General Specifications
Gate voltage:±40 V
Voltage range:0.2 ~ 5 kV
Maximum measurement current:2 kA
Current measurement resolution:250 fA
Catalog PDF file |
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IWATSU ELECTRIC
https://www.iwatsu.co.jp/tme/- Japan exhibitors
- Real
- TECHNO-FRONTIER 2025
- POWER ELECTRONICS JAPAN
- Booth number 4-AA33