ON Voltage Probe for SiC/GaN SS-350 IWATSU ELECTRIC

SIC, GaN, MOSFET, inverter module, thermal characteristics
Evaluation of Temperature Dependence of ON Resistance of SiC Devices
Detect the effect of abnormal temperature rise of ON voltage
Measurement of ON voltage rise caused by overcurrent condition

It reliably measures the ON voltage of switching devices.

The SS-350 probe measures the voltage between switches (ON voltage) when switching devices, such as MOSFETs, are turned on.
By limiting the high voltage that occurs when the devices are turned off, the probe can accurately measure the low ON voltage.
The low ON voltage can then be measured more accurately.

Maximum input voltage +2,000Vpeak
Clamp voltage +1.5V / +2.5V / +5.5V
Clamp voltage and offset voltage can be set and powered from our DS-8000 series oscilloscopes.
* This product can be used only with our DS-8000 series oscilloscopes.