TLP/CMTI Generator IWATSU ELECTRIC

Semiconductor Devices, LSI, Power Supplies, Interface, Memory, Electrical Equipment, Mobile Phone, IC Modules, ESD Testing, TLP, CMTI

TheuniversalTLP/VF-TLP/HMMtestsystemTLP-4010C/3011C
offers advanced features intended for the characterization of circuits, semiconductor devices and discretes like TVS,
varistors, capacitors, in the high-power time domain. It includes high current I-V characteristics in pulsed operation mode,
turn-on/off transient characteristics of the device, breakdown effects, charge recovery effects (e.g. reverse recovery), Safe Operating-Area (SOA) and ESD measurements.

Wafer and package level TLP/VF-TLP/HMM testing
• Ultrafast 50Ω high voltage pulse output with typical
100psrise time
• Built-in HMM(IEC61000-4-2) pulse up to ±10kV
• Highpulseoutputcurrentupto±40A
• High speed 50Ω trigger output for oscilloscopes (synchronous to high voltage pulse output)
• 6programmablepulserisetimes: 100psto50ns
• 8 (optional 9) programmable pulse widths: 0.5ns (optional), 1 ns to 100ns
• Optional pulse width extender increases pulse width up to 1.6µs in 68 programmable steps
• Fast measurement time, typically 0.2s per pulse including one-point DC measurement between pulses
• Efficient software for system control and waveform data management
• The software can control automatic probers (Suss) for fast measurement of complete wafers
• High performance and high-quality component